Journalartikel

Jahr der Veröffentlichung: 2005

Seiten: 21825-21830

Zeitschrift: Journal of Physical Chemistry B (Soft Condensed Matter and Biophysical Chemistry)

Bandnummer: 109

Heftnummer: 46

ISSN: 1520-5207

DOI Link: https://doi.org/10.1021/jp0538520

Verlag: American Chemical Society

Abstract: 
With surface X-ray diffraction (SXRD) using a high-pressure reaction chamber we investigated in-situ the oxidation of the Ru(0001) model catalyst under various reaction conditions, starting from a strongly oxidizing environment to reaction conditions typical for CO oxidation. With a mixture of O(2) and CO (stoichiometry, 2:1) the partial pressure of oxygen has to be increased to 20 mbar to form the catalytically active RuO(2)(110) oxide film, while in pure oxygen environment a pressure of 10(-5) mbar is already sufficient to oxidize the Ru(0001) surface. For preparation temperatures in the range of 550-630 K a self-limiting RuO(2)(110) film is produced with a thickness of 1.6 nm. The RuO(2)(110) film grows self-acceleratedly after an induction period. The RuO(2) films on Ru(0001) can readily be reduced by H(2) and CO exposures at 415 K, without an induction period.

Harvard-Zitierstil: He, Y., Knapp, M., Lundgren, E. and Over, H. (2005) Ru(0001) model catalyst under oxidizing and reducing reaction conditions: in-situ high-pressure surface X-ray diffraction study, Journal of Physical Chemistry B (Soft Condensed Matter and Biophysical Chemistry), 109(46), pp. 21825-21830. https://doi.org/10.1021/jp0538520

APA-Zitierstil: He, Y., Knapp, M., Lundgren, E., & Over, H. (2005). Ru(0001) model catalyst under oxidizing and reducing reaction conditions: in-situ high-pressure surface X-ray diffraction study. Journal of Physical Chemistry B (Soft Condensed Matter and Biophysical Chemistry). 109(46), 21825-21830. https://doi.org/10.1021/jp0538520