Konferenzpaper

Erschienen in: Structure of Surfaces IV

Herausgeberliste: Xie, X; Tong, SY; Van Hove, MA

Jahr der Veröffentlichung: 1994

Seiten: 103-112

ISBN: 978-981-0215-51-4

eISBN: 978-981-4535-16-8

DOI Link: https://doi.org/10.1142/2163

Konferenz: 4th International Conference on the Structure of Surfaces

Harvard-Zitierstil: Moritz, W. and Over, H. (1994) Anisotropic temperature factors in the calculation of low-energy electron diffraction intensities, in Xie, X., Tong, S. and Van Hove, M. (eds.) Structure of Surfaces IV. Singapore: World Scientific. pp. 103-112. https://doi.org/10.1142/2163

APA-Zitierstil: Moritz, W., & Over, H. (1994). Anisotropic temperature factors in the calculation of low-energy electron diffraction intensities. In Xie, X., Tong, S., & Van Hove, M. (Eds.), Structure of Surfaces IV. (pp. 103-112). World Scientific. https://doi.org/10.1142/2163