Journal article

Publication year: 2009

Pages: 69-77

Journal: Journal of Electron Spectroscopy and Related Phenomena

Volume number: 172

Issue number: 1-3

Open access status: Green

DOI Link: https://doi.org/10.1016/j.elspec.2009.03.011

Publisher: Elsevier

Abstract: 

Near-edge X-ray absorption fine structure spectroscopy (NEXAFS) is a
powerful tool for determination of molecular orientation in
self-assembled monolayers and other surface-attached molecules. A
general framework for using NEXAFS to simultaneously determine molecular
tilt and twist of rigid molecules attached to surfaces is presented.
This framework is applied to self-assembled monolayers of higher
diamondoids, hydrocarbon molecules with cubic-diamond-cage structures.
Diamondoid monolayers chemisorbed on metal substrates are known to
exhibit interesting electronic and surface properties. This work
compares molecular orientation in monolayers prepared on silver
substrates using two different thiol positional isomers of
[121]tetramantane, and thiols derived from two different pentamantane
structural isomers, [1212]pentamantane and [1(2,3)4]pentamantane. The
observed differences in monolayer structure demonstrate the utility and
limitations of NEXAFS spectroscopy and the framework. The results also
demonstrate the ability to control diamondoid assembly, in particular
the molecular orientational structure, providing a flexible platform for
the modification of surface properties with this exciting new class of
nanodiamond materials.

Harvard Citation style: Willey, T., Lee, J., Fabbri, J., Wang, D., Nielsen, M., Randel, J., et al. (2009) Determining orientational structure of diamondoid thiols attached to silver using near-edge X-ray absorption fine structure spectroscopy, Journal of Electron Spectroscopy and Related Phenomena, 172(1-3), pp. 69-77. https://doi.org/10.1016/j.elspec.2009.03.011

APA Citation style: Willey, T., Lee, J., Fabbri, J., Wang, D., Nielsen, M., Randel, J., Schreiner, P., Fokin, A., Tkachenko, B., Fokina, N., Dahl, J., Carlson, R., Terminello, L., Melosh, N., & van Buuren, T. (2009). Determining orientational structure of diamondoid thiols attached to silver using near-edge X-ray absorption fine structure spectroscopy. Journal of Electron Spectroscopy and Related Phenomena. 172(1-3), 69-77. https://doi.org/10.1016/j.elspec.2009.03.011