Journalartikel

Jahr der Veröffentlichung: 1994

Seiten: 2071-2076

Zeitschrift: Analytical Chemistry

Bandnummer: 66

Heftnummer: 13

ISSN: 0003-2700

DOI Link: https://doi.org/10.1021/ac00085a023

Verlag: American Chemical Society

Abstract: 
A new instrument is presented allowing in situ single-particle analysis by pulsed laser-induced ionization and time-of-flight mass analysis. Particles are introduced into the mass spectrometer through a differentially pumped interface system, detected by light scattering caused by a He-Ne laser beam and ionized by a pulsed UV laser. Instrumental performance is demonstrated using artificial aerosols. Application to on-line mass analysis of ambient aerosol particles is reported for the first dine.

Harvard-Zitierstil: Hinz, K., Kaufmann, R. and Spengler, B. (1994) Laser-Induced Mass Analysis of Single Particles in the Airborne State, Analytical Chemistry, 66(13), pp. 2071-2076. https://doi.org/10.1021/ac00085a023

APA-Zitierstil: Hinz, K., Kaufmann, R., & Spengler, B. (1994). Laser-Induced Mass Analysis of Single Particles in the Airborne State. Analytical Chemistry. 66(13), 2071-2076. https://doi.org/10.1021/ac00085a023