Journal article

Publication year: 2002

Pages: 624-633

Journal: Journal of Applied Crystallography

Volume number: 35

Issue number: 5

ISSN: 0021-8898

DOI Link: https://doi.org/10.1107/S0021889802011007

Publisher: International Union of Crystallography

Abstract: 
The wide-angle X-ray scattering (WAXS) of non-graphitic carbons shows relatively broad and diffuse interference maxima. In most cases, the corresponding line profiles cannot be separated unambiguously, so that an evaluation using profile analysis is difficult. In these cases, fitting procedures for the total scattering curve are more appropriate. This requires theoretical expressions for all interference maxima with a sufficient number of relevant structural parameters to ensure an acceptable fit. In this paper, such expressions are presented for the (hk) lines (intralayer scattering) and the (00l) lines (interlayer scattering), and the application of these expressions to the evaluation of selected WAXS curves is described. Furthermore, the effects of thermal motion, preferred orientation and Compton scattering are discussed.

Harvard Citation style: Ruland, W. and Smarsly, B. (2002) X-ray scattering of non-graphitic carbon : an improved method of evaluation, Journal of Applied Crystallography, 35(5), pp. 624-633. https://doi.org/10.1107/S0021889802011007

APA Citation style: Ruland, W., & Smarsly, B. (2002). X-ray scattering of non-graphitic carbon : an improved method of evaluation. Journal of Applied Crystallography. 35(5), 624-633. https://doi.org/10.1107/S0021889802011007