Konferenzpaper

Erschienen in: EMC 2008. 14th European Microscopy Congress, Volume 2: Materials Science

Herausgeberliste: Richter, S; Schwedt, A

Jahr der Veröffentlichung: 2008

Seiten: 369-370

ISBN: 978-3-540-85225-4

eISBN: 978-3-540-85226-1

DOI Link: https://doi.org/10.1007/978-3-540-85226-1_185

Konferenz: 14th European Microscopy Congress (EMC 2008)

Abstract: 

Metal-ceramic interfaces are of fundamental importance for a variety of industrial applications and are also of scientific interest. The physical and chemical properties of several technologically relevant nano-structural materials and devices are strongly affected and controlled by the presence of interfaces between the components. Already small amounts of impurities at the interface can dramatically change the properties of the system.

Harvard-Zitierstil: Srot, V., Watanabe, M., Scheu, C., van Aken, P., Mutoro, E., Janek, J., et al. (2008) Analytical TEM investigations of Pt/YSZ interfaces, in Richter, S. and Schwedt, A. (eds.) EMC 2008. 14th European Microscopy Congress, Volume 2: Materials Science. Berlin: Springer Verlag. pp. 369-370. https://doi.org/10.1007/978-3-540-85226-1_185

APA-Zitierstil: Srot, V., Watanabe, M., Scheu, C., van Aken, P., Mutoro, E., Janek, J., & Rühle, M. (2008). Analytical TEM investigations of Pt/YSZ interfaces. In Richter, S., & Schwedt, A. (Eds.), EMC 2008. 14th European Microscopy Congress, Volume 2: Materials Science. (pp. 369-370). Springer Verlag. https://doi.org/10.1007/978-3-540-85226-1_185