Journalartikel

Jahr der Veröffentlichung: 2007

Seiten: 409-417

Zeitschrift: Journal of Applied Crystallography

Bandnummer: 40

Heftnummer: 3

ISSN: 0021-8898

DOI Link: https://doi.org/10.1107/S0021889807010503

Verlag: International Union of Crystallography

Abstract: 
Mesostructured oxide films were prepared by dip-coating from colloidal solutions on ultrathin Si wafers and solidified by heating at various temperatures. Two-dimensional small-angle X-ray scattering measurements were carried out in transmission under selected tilt angles and evaluated by comparison with analytical expressions. The films are composed of oriented mesophases, the structures of which are defined in terms of lattice type, preferred orientation, deformation and imperfection, notably stacking faults.

Harvard-Zitierstil: Ruland, W. and Smarsly, B. (2007) Two-dimensional small-angle X-ray scattering of self-assembled nanocomposite films with oriented arrays of spheres : determination of lattice type, preferred orientation, deformation and imperfection, Journal of Applied Crystallography, 40(3), pp. 409-417. https://doi.org/10.1107/S0021889807010503

APA-Zitierstil: Ruland, W., & Smarsly, B. (2007). Two-dimensional small-angle X-ray scattering of self-assembled nanocomposite films with oriented arrays of spheres : determination of lattice type, preferred orientation, deformation and imperfection. Journal of Applied Crystallography. 40(3), 409-417. https://doi.org/10.1107/S0021889807010503