Journal article
Authors list: Schwegmann, S; Over, H; Gierer, M; Ertl, G
Publication year: 1996
Pages: 11164-11169
Journal: Physical Review B
Volume number: 53
Issue number: 16
ISSN: 0163-1829
DOI Link: https://doi.org/10.1103/PhysRevB.53.11164
Publisher: American Physical Society
The epitaxial growth of incommensurate Mg layers on a Ru(0001) surface is investigated in the coverage range from submonolayers to 3 ML by analyzing low-energy electron-diffraction LEED I(V) data. For the analysis of the 2-ML Mg film, we developed an efficient approximation scheme that allows the determination of mean interlayer spacings without employing the full unit cell. The Mg-Ru spacing is found to be 2.32±0.05 Å, regardless of the presence of further Mg layers above. The Mg-Mg layer spacing in the Mg bilayer is 5%, expanded with respect to the value of the bulk material, while this layer spacing is expanded by only 2.5% after completion of the third Mg layer. The ABAB... stacking sequence is established from the beginning of the film growth.
Abstract:
Citation Styles
Harvard Citation style: Schwegmann, S., Over, H., Gierer, M. and Ertl, G. (1996) Initial growth of Mg films on Ru(0001): An efficient approximation scheme for the LEED analysis of incommensurate structures, Physical Review B, 53(16), pp. 11164-11169. https://doi.org/10.1103/PhysRevB.53.11164
APA Citation style: Schwegmann, S., Over, H., Gierer, M., & Ertl, G. (1996). Initial growth of Mg films on Ru(0001): An efficient approximation scheme for the LEED analysis of incommensurate structures. Physical Review B. 53(16), 11164-11169. https://doi.org/10.1103/PhysRevB.53.11164