Journal article

Secondary‐ion generation from large keV molecular primary ions incident on a stainless‐steel dynode


Authors listKaufmann, R; Kirsch, D; Rood, HA; Spengler, B

Publication year1992

Pages98-104

JournalRapid Communications in Mass Spectrometry

Volume number6

Issue number2

ISSN0951-4198

DOI Linkhttps://doi.org/10.1002/rcm.1290060206

PublisherWiley


Abstract
Positive and negative secondary ions from large (up to 40 kDa) peptide and protein primary ions incident at 5-40 keV collisional energies on a stainless-steel (mesh) conversion dynode have been investigated in a tandem (reflectron) time-of-flight arrangement. Negative secondary-ion spectra consisted mainly of H- and C2H-, C2H2- ions; positive secondary-ion spectra were more complex and contained prominent signals due to H+, Na+ and K+, and further signals at m/z 28, 41, 43, 45, 73 up to m/z 326. The secondary mass spectra were qualitatively very similar amongst the various peptide primaries and not different from those of other organic projectiles such as, for example, coronene or cyclodextrin. With increasing mass of the primary ion, ratios of the secondary-ion abundances changed drastically in the negative secondary-ion spectra (increase of higher m/z signals, decrease of H-). Since most of the positive secondary ions could be attributed to a silicon-organic surface contamination of the dynode (vacuum grease), it is concluded that the formation of such secondary ions is due to sputtering rather than surface-induced dissociation.



Citation Styles

Harvard Citation styleKaufmann, R., Kirsch, D., Rood, H. and Spengler, B. (1992) Secondary‐ion generation from large keV molecular primary ions incident on a stainless‐steel dynode, Rapid Communications in Mass Spectrometry, 6(2), pp. 98-104. https://doi.org/10.1002/rcm.1290060206

APA Citation styleKaufmann, R., Kirsch, D., Rood, H., & Spengler, B. (1992). Secondary‐ion generation from large keV molecular primary ions incident on a stainless‐steel dynode. Rapid Communications in Mass Spectrometry. 6(2), 98-104. https://doi.org/10.1002/rcm.1290060206


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