Journal article

Publication year: 2005

Pages: 113108-

Journal: Applied Physics Letters

Volume number: 86

Issue number: 11

ISSN: 0003-6951

DOI Link: https://doi.org/10.1063/1.1887821

Publisher: American Institute of Physics

Abstract: 
Two-dimensional hexagonal silica thin films templated by a triblock copolymer were investigated by grazing incident small angle x-ray scattering (GISAXS) and x-ray reflectivity (XR) before and after removing the surfactant from the silica matrix. XR curves-analyzed above and below the critical angle of the substrate-are evaluated by the matrix technique to obtain the average electron density of the films, the wall thickness, the electron density of the walls, the radius of the pores, and subsequently the porosity of such mesoporous films. In combination with GISAXS, the surface area of the mesopores is ascertained, thereby providing a complete analysis of the porosity in thin films by x-ray scattering methods.

Harvard Citation style: Dourdain, S., Bardeau, J., Colas, M., Smarsly, B., Mehdi, A., Ocko, B., et al. (2005) Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films, Applied Physics Letters, 86(11), p. 113108. https://doi.org/10.1063/1.1887821

APA Citation style: Dourdain, S., Bardeau, J., Colas, M., Smarsly, B., Mehdi, A., Ocko, B., & Gibaud, A. (2005). Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films. Applied Physics Letters. 86(11), 113108. https://doi.org/10.1063/1.1887821