Journal article

Publication year: 2004

Pages: 575-584

Journal: Journal of Applied Crystallography

Volume number: 37

Issue number: 4

ISSN: 0021-8898

DOI Link: https://doi.org/10.1107/S0021889804011288

Publisher: International Union of Crystallography

Abstract: 
Oriented lamellar nanocomposites formed of alternating organic and inorganic layers were prepared by evaporation-induced self-assembly and studied by small-angle X-ray scattering in symmetrical and asymmetrical reflection. Analytical expressions were used for a quantitative fit of the experimental data. The fitting procedure leads to a comprehensive characterization of the lamellar two-phase system in terms of the average thicknesses of the lamellae, the average period and the corresponding variances, using both the stacking model and the lattice model. Furthermore, the width of the domain boundary and the preferred orientation were determined. No significant differences could be found between the parameters obtained for the two models, but the lattice model leads to a better curve fitting. The effects of finite stack height and of instrumental broadening were found to be indistinguishable.

Harvard Citation style: Ruland, W. and Smarsly, B. (2004) SAXS of self-assembled oriented lamellar nanocomposite films : an advanced method of evaluation, Journal of Applied Crystallography, 37(4), pp. 575-584. https://doi.org/10.1107/S0021889804011288

APA Citation style: Ruland, W., & Smarsly, B. (2004). SAXS of self-assembled oriented lamellar nanocomposite films : an advanced method of evaluation. Journal of Applied Crystallography. 37(4), 575-584. https://doi.org/10.1107/S0021889804011288