Journalartikel

Jahr der Veröffentlichung: 2014

Seiten: 1235-1242

Zeitschrift: Journal of the European Ceramic Society

Bandnummer: 34

Heftnummer: 5

ISSN: 0955-2219

DOI Link: https://doi.org/10.1016/j.jeurceramsoc.2013.11.043

Verlag: Elsevier

Abstract: 
Thin Gd2O3 films with a thickness of about 150 nm were deposited by pulsed layer deposition on polycrystalline CeO2 substrates to study the structural evolution of the Ce1-xGdxO2-x/2 system with respect to phase formation and cation interdiffusion in the temperature range between 986 degrees C and 1270 degrees C. Transmission electron microscopy combined with quantitative energy dispersive X-ray spectroscopy was applied to study the microstructure and to obtain composition profiles across the Gd2O3/CeO2-interface. Gd2O3 was observed to occur in the bixbyite structure up to 1175 degrees C. The fluorite and the bixbyite phase are found at intermediate compositions without any indication for a miscibility gap. Interdiffusion coefficients were obtained from Gd2O3/CeO2-concentration profiles on the basis of the diffusion-couple solution of the diffusion equation. The activation enthalpy and frequency factor of the diffusion coefficient were derived assuming an Arrhenius-type behavior in the investigated temperature range. (C) 2013 Elsevier Ltd. All rights reserved.

Harvard-Zitierstil: Rockenhäuser, C., Butz, B., Schichtel, N., Janek, J., Oberacker, R., Hoffmann, M., et al. (2014) Microstructure evolution and cation interdiffusion in thin Gd2O3 films on CeO2 substrates, Journal of the European Ceramic Society, 34(5), pp. 1235-1242. https://doi.org/10.1016/j.jeurceramsoc.2013.11.043

APA-Zitierstil: Rockenhäuser, C., Butz, B., Schichtel, N., Janek, J., Oberacker, R., Hoffmann, M., & Gerthsen, D. (2014). Microstructure evolution and cation interdiffusion in thin Gd2O3 films on CeO2 substrates. Journal of the European Ceramic Society. 34(5), 1235-1242. https://doi.org/10.1016/j.jeurceramsoc.2013.11.043