Journalartikel

Jahr der Veröffentlichung: 2005

Seiten: 072102-

Zeitschrift: Applied Physics Letters

Bandnummer: 86

Heftnummer: 7

ISSN: 0003-6951

eISSN: 1077-3118

DOI Link: https://doi.org/10.1063/1.1866642

Verlag: American Institute of Physics

Abstract: 
In the present study, we investigated the galvanomagnetic transport properties of polycrystalline AgxSe thin films with silver excess in the range from x = 1.5 to 18. The results prove that the silver excess controls the transition from linear magnetoresistance (MR) behavior to the quadratic ordinary MR and the temperature for the metal-semiconductor transition. Analyzing the MR effect by Kohler's rule and comparing the results with the field-free resistivity we observe for 2 < x < 2.3 a steep rise of the product of mean free path and electron concentration (lambda - .n(2/3)). We interpret this result as a consequence of the percolation of nanoscale silver networks within the semiconducting matrix, i.e., as a consequence of the two-phase character of the system.

Harvard-Zitierstil: von Kreutzbruck, M., Mogwitz, B., Gruhl, F., Kienle, L., Korte, C. and Janek, J. (2005) Magnetoresistance in Ag2+delta Se with high silver excess, Applied Physics Letters, 86(7), p. 072102. https://doi.org/10.1063/1.1866642

APA-Zitierstil: von Kreutzbruck, M., Mogwitz, B., Gruhl, F., Kienle, L., Korte, C., & Janek, J. (2005). Magnetoresistance in Ag2+delta Se with high silver excess. Applied Physics Letters. 86(7), 072102. https://doi.org/10.1063/1.1866642