Journalartikel
Autorenliste: Lee, TH; Cheong, HW; Kwon, O; Whang, KW; Steinmüller, SO; Janek, J
Jahr der Veröffentlichung: 2011
Seiten: 171501-
Zeitschrift: Applied Physics Letters
Bandnummer: 99
Heftnummer: 17
ISSN: 0003-6951
eISSN: 1077-3118
DOI Link: https://doi.org/10.1063/1.3655329
Verlag: American Institute of Physics
Abstract:
Plasma display panel (PDP) with MgO-SrO double cathode layer and SiO(2) diffusion barrier is proposed to make the SrO layer free of contaminations. Time of flight-secondary ion mass spectrometry (TOF-SIMS) analysis shows the diffusion of impurities, like Na and K, can be effectively blocked while a new SrO layer is formed on top of the MgO layer. This structure shows that high Xe gases can be used to improve the luminous efficacy 2.3 times and decrease the voltage margin more than 10 V compared to the conventional PDP using Ne-Xe 15%. The aging time was also significantly decreased to 3-4 h.
Zitierstile
Harvard-Zitierstil: Lee, T., Cheong, H., Kwon, O., Whang, K., Steinmüller, S. and Janek, J. (2011) The role of a diffusion barrier in plasma display panel with the high gamma cathode layer, Applied Physics Letters, 99(17), p. 171501. https://doi.org/10.1063/1.3655329
APA-Zitierstil: Lee, T., Cheong, H., Kwon, O., Whang, K., Steinmüller, S., & Janek, J. (2011). The role of a diffusion barrier in plasma display panel with the high gamma cathode layer. Applied Physics Letters. 99(17), 171501. https://doi.org/10.1063/1.3655329