Journal article

The electrode model system Pt(O2)|YSZ: Influence of impurities and electrode morphology on cyclic voltammograms


Authors listMutoroa, E; Luerßen, B; Günther, S; Janek, J

Publication year2009

Pages1019-1033

JournalSolid State Ionics

Volume number180

Issue number17-19

ISSN0167-2738

DOI Linkhttps://doi.org/10.1016/j.ssi.2009.04.012

PublisherElsevier


Abstract
This study is focused on the influence of impurities and electrode
morphology on cyclic voltammograms (CV) of one of the most prominent
solid state electrode systems, Pt(O2)|YSZ, exemplifying the
difficulties in unequivocal interpretation of CV in the solid state in
general. By investigating differently prepared electrodes—either by Pt
paste or pulsed laser deposition (PLD)—with and without an Si containing
additive, the impact of both effects can be separated. For
characterisation of the sample SEM, XRD, EDX, Tof-SIMS, XPS, and XPEEM
have been used. We demonstrate that the presence of impurities can
change the shape of CV and even cause peaks, a fact which has not been
considered so far. The processes which theoretically can cause a CV peak
in the electrode system Pt(O2)|YSZ are discussed. We
reconsider the information unambiguously obtainable from CV studies, and
we comment on the controversial questions of the formation of interface
Pt oxide and the appearance of spillover oxygen in CV studies. A
compact commented survey of literature on CV studies of the system Pt(O2)|YSZ is given.




Citation Styles

Harvard Citation styleMutoroa, E., Luerßen, B., Günther, S. and Janek, J. (2009) The electrode model system Pt(O2)|YSZ: Influence of impurities and electrode morphology on cyclic voltammograms, Solid State Ionics, 180(17-19), pp. 1019-1033. https://doi.org/10.1016/j.ssi.2009.04.012

APA Citation styleMutoroa, E., Luerßen, B., Günther, S., & Janek, J. (2009). The electrode model system Pt(O2)|YSZ: Influence of impurities and electrode morphology on cyclic voltammograms. Solid State Ionics. 180(17-19), 1019-1033. https://doi.org/10.1016/j.ssi.2009.04.012


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