Journal article

Publication year: 2007

Pages: 7375-7380

Journal: Journal of Materials Science

Volume number: 42

Issue number: 17

ISSN: 0022-2461

eISSN: 1573-4803

DOI Link: https://doi.org/10.1007/s10853-006-1310-2

Publisher: Springer

Abstract: 
Thin films of silver selenide with varying composition have been deposited on magnesium oxide substrates with pulsed laser deposition and were investigated via micro-XRF. A calibration procedure was designed to determine the absolute thicknesses of the films. The lateral homogeneity was investigated by elemental mapping, thus delivering information about the deposition process. Wet chemical analysis was performed on the dissolved layers with ICP-OES and ICP-MS to determine the stoichiometry of the Ag (x) Se (y) . The results suggest a correlation between the composition of the layers and their thicknesses by showing a silver enrichment for thinner layers.

Harvard Citation style: Dargel, R., Azeroual, M., Mogwitz, B., Janek, J. and Vogt, C. (2007) Non-destructive analysis of silver selenide films obtained by Pulsed Laser Deposition (PLD) with Micro-XRF, Journal of Materials Science, 42(17), pp. 7375-7380. https://doi.org/10.1007/s10853-006-1310-2

APA Citation style: Dargel, R., Azeroual, M., Mogwitz, B., Janek, J., & Vogt, C. (2007). Non-destructive analysis of silver selenide films obtained by Pulsed Laser Deposition (PLD) with Micro-XRF. Journal of Materials Science. 42(17), 7375-7380. https://doi.org/10.1007/s10853-006-1310-2