Journal article

Publication year: 2010

Pages: 1616-1622

Journal: Solid State Ionics

Volume number: 181

Issue number: 35-36

ISSN: 0167-2738

DOI Link: https://doi.org/10.1016/j.ssi.2010.08.026

Publisher: Elsevier

Abstract: 
Platinum/yttria stabilized zirconia (Pt/YSZ) interfaces with two different orientation relationships were characterized using advanced analytical transmission electron microscopy methods. Quantitative X-ray energy dispersive spectroscopy (XEDS) was performed by the recently developed zeta-factor method. Neither interdiffusion nor segregation was detected across the Pt/YSZ interfaces of both orientation conditions within the resolution limit of the technique. The interface specific components of the electron energy-loss near-edge structures (EWES) were extracted by employing the spatial difference technique. Features of the O-K EWES at the interface are distinctly different from that at bulk YSZ indicating Pt-O bonding. The experimentally observed changes in the O-K ELNES are in good agreement with the results of ab-initio full multiple scattering calculation, based on structure modeling at the interfaces.

Harvard Citation style: Srot, V., Watanabe, M., Scheu, C., van Aken, P., Salzberger, U., Luerssen, B., et al. (2010) Characterization of chemical composition and electronic structure of Pt/YSZ interfaces by analytical transmission electron microscopy, Solid State Ionics, 181(35-36), pp. 1616-1622. https://doi.org/10.1016/j.ssi.2010.08.026

APA Citation style: Srot, V., Watanabe, M., Scheu, C., van Aken, P., Salzberger, U., Luerssen, B., Janek, J., & Rühle, M. (2010). Characterization of chemical composition and electronic structure of Pt/YSZ interfaces by analytical transmission electron microscopy. Solid State Ionics. 181(35-36), 1616-1622. https://doi.org/10.1016/j.ssi.2010.08.026