Journal article
Authors list: Aad, G.; Abbott, B.; Abbott, D. C.; Abud, A. Abed; Abeling, K.; Abhayasinghe, D. K.; Abidi, S. H.; AbouZeid, O. S.; Abraham, N. L.; Abramowicz, H.; Abreu, H.; Abulaiti, Y.; Abusleme Hoffman, A. C.; Acharya, B. S.; Achkar, B.; Adam, L.; Bourdarios, C. Adam; Adamczyk, L.; Adamek, L.; Adelman, J.; Adiguzel, A.; Adorni, S.; Adye, T.; Affolder, A. A.; Afik, Y.; Agapopoulou, C.; Agaras, M. N.; Aggarwal, A.; Agheorghiesei, C.; Aguilar-Saavedra, J. A.; Ahmad, A.; Ahmadov, F.; Ahmed, W. S.; Ai, X.; Aielli, G.; Akatsuka, S.; Akbiyik, M.; Akesson, T. P. A.; Akilli, E.; Akimov, A., V; Al Khoury, K.; Alberghi, G. L.; Albert, J.; Verzini, M. J. Alconada; Alderweireldt, S.; Aleksa, M.; Aleksandrov, I. N.; Alexa, C.; Alexopoulos, T.; Alfonsi, A.; Alfonsi, F.; Alhroob, M.; Ali, B.; Ali, S.; Aliev, M.; Alimonti, G.; Allaire, C.; Allbrooke, B. M. M.; Allport, P. P.; Aloisio, A.; Alonso, F.; Alpigiani, C.; Camelia, E. Alunno; Alvarez Estevez, M.; Alviggi, M. G.; Coutinho, Y. Amaral; Ambler, A.; Ambroz, L.; Amelung, C.; Amidei, D.; Amor Dos Santos, S. P.; Amoroso, S.; Amrouche, C. S.; Anastopoulos, C.; Andari, N.; Andeen, T.; Anders, J. K.; Andrean, S. Y.; Andreazza, A.; Andrei, V; Anelli, C. R.; Angelidakis, S.; Angerami, A.; Anisenkov, A., V; Annovi, A.; Antel, C.; Anthony, M. T.; Antipov, E.; Antonelli, M.; Antrim, D. J. A.; Anulli, F.; Aoki, M.; Aparisi Pozo, J. A.; Aparo, M. A.; Aperio Bella, L.; Aranzabal, N.; Ferraz, V. Araujo; Arcangeletti, C.; Arce, A. T. H.; Arguin, J-F; Argyropoulos, S.; Arling, J-H; Armbruster, A. J.; Armstrong, A.; Arnaez, O.; Arnold, H.; Tame, Z. P. Arrubarrena; Artoni, G.; Asada, H.; Asai, K.; Asai, S.; Asbah, N. A.; Asimakopoulou, E. M.; Asquith, L.; Assahsah, J.; Assamagan, K.; Astalos, R.; Atkin, R. J.; Atkinson, M.; Atlay, N. B.; Atmani, H.; Atmasiddha, P. A.; Augsten, K.; Austrup, V. A.; Avolio, G.; Ayoub, M. K.; Azuelos, G.; Babal, D.; Bachacou, H.; Bachas, K.; Backman, F.; Bagnaia, P.; Bahrasemani, H.; Bailey, A. J.; Bailey, V. R.; Baines, J. T.; Bakalis, C.; Baker, O. K.; Bakker, P. J.; Bakos, E.; Gupta, D. Bakshi; Balaji, S.; Balasubramanian, R.; Baldin, E. M.; Balek, P.; Balli, F.; Balunas, W. K.; Balz, J.; Banas, E.; Bandieramonte, M.; Bandyopadhyay, A.; Barak, L.; Barbe, W. M.; Barberio, E. L.; Barberis, D.; Barbero, M.; Barbour, G.; Barends, K. N.; Barillari, T.; Barisits, M-S; Barkeloo, J.; Barklow, T.; Barnett, B. M.; Barnett, R. M.; Barnovska-Blenessy, Z.; Baroncelli, A.; Barone, G.; Barr, A. J.; Navarro, L. Barranco; Barreiro, F.; Guimaraes da Costa, J. Barreiro; Barron, U.; Barsov, S.; Bartels, F.; Bartoldus, R.; Bartolini, G.; Barton, A. E.; Bartos, P.; Basalaev, A.; Basan, A.; Bassalat, A.; Basso, M. J.; Basson, C. R.; Bates, R. L.; Batlamous, S.; Batley, J. R.; Batool, B.; Battaglia, M.; Bauce, M.; Bauer, F.; Bauer, P.; Bawa, H. S.; Bayirli, A.; Beacham, J. B.; Beau, T.; Beauchemin, P. H.; Becherer, F.; Bechtle, P.; Beck, H. P.; Becker, K.; Becot, C.; Beddall, A. J.; Bednyakov, V. A.; Bee, C. P.; Beermann, T. A.; Begalli, M.; Begel, M.; Behera, A.; Behr, J. K.; Beirer, J. F.; Beisiegel, F.; Belfkir, M.; Bella, G.; Bellagamba, L.; Bellerive, A.; Bellos, P.; Beloborodov, K.; Belotskiy, K.; Belyaev, N. L.; Benchekroun, D.; Benekos, N.; Benhammou, Y.; Benjamin, D. P.; Benoit, M.; Bensinger, J. R.; Bentvelsen, S.; Beresford, L.; Beretta, M.; Berge, D.; Kuutmann, E. Bergeaas; Berger, N.; Bergmann, B.; Bergsten, L. J.; Beringer, J.; Berlendis, S.; Bernardi, G.; Bernius, C.; Bernlochner, F. U.; Berry, T.; Berta, P.; Berthold, A.; Bertram, I. A.; Bylund, O. Bessidskaia; Bethke, S.; Betti, A.; Bevan, A. J.; Bhatta, S.; Bhattacharya, D. S.; Bhattarai, P.; Bhopatkar, V. S.; Bi, R.; Bianchi, R. M.; Biebel, O.; Bielski, R.; Bierwagen, K.; Biesuz, N., V; Biglietti, M.; Billoud, T. R., V; Bindi, M.; Bingul, A.; Bini, C.; Biondi, S.; Birch-sykes, C. J.; Bird, G. A.; Birman, M.; Bisanz, T.; Biswal, J. P.; Biswas, D.; Bitadze, A.; Bittrich, C.; Bjorke, K.; Blazek,
Publication year: 2021
Journal: Journal of Instrumentation
Volume number: 16
Issue number: 8
ISSN: 1748-0221
DOI Link: https://doi.org/10.1088/1748-0221/16/08/P08025
Publisher: IOP Publishing
Abstract:
Non-ionizing energy loss causes bulk damage to the silicon sensors of the ATLAS pixel and strip detectors. This damage has important implications for data-taking operations, charged-particle track reconstruction, detector simulations, and physics analysis. This paper presents simulations and measurements of the leakage current in the ATLAS pixel detector and semiconductor tracker as a function of location in the detector and time, using data collected in Run 1 (2010-2012) and Run 2 (2015-2018) of the Large Hadron Collider. The extracted fluence shows a much stronger vertical bar z vertical bar-dependence in the innermost layers than is seen in simulation. Furthermore, the overall fluence on the second innermost layer is significantly higher than in simulation, with better agreement in layers at higher radii. These measurements are important for validating the simulation models and can be used in part to justify safety factors for future detector designs and interventions.
Citation Styles
Harvard Citation style: Aad, G., Abbott, B., Abbott, D., Abud, A., Abeling, K., Abhayasinghe, D., et al. (2021) Measurements of sensor radiation damage in the ATLAS inner detector using leakage currents, Journal of Instrumentation, 16(8), Article P08025. https://doi.org/10.1088/1748-0221/16/08/P08025
APA Citation style: Aad, G., Abbott, B., Abbott, D., Abud, A., Abeling, K., Abhayasinghe, D., Abidi, S., AbouZeid, O., Abraham, N., Abramowicz, H., Abreu, H., Abulaiti, Y., Abusleme Hoffman, A., Acharya, B., Achkar, B., Adam, L., Bourdarios, C., Adamczyk, L., Adamek, L., ...Blazek, (2021). Measurements of sensor radiation damage in the ATLAS inner detector using leakage currents. Journal of Instrumentation. 16(8), Article P08025. https://doi.org/10.1088/1748-0221/16/08/P08025
Keywords
Detector modelling and simulations I (interaction of radiation with matter, interaction of photons with matter, interaction of hadrons with matter, etc); DISPLACEMENT DAMAGE; HADRON-NUCLEUS; Radiation damage to detector materials (solid state); RESIDUAL NUCLEI