Journalartikel

Jahr der Veröffentlichung: 2020

Seiten: 2194-2201

Zeitschrift: Crystal Growth and Design

Bandnummer: 20

Heftnummer: 4

ISSN: 1528-7483

eISSN: 1528-7505

DOI Link: https://doi.org/10.1021/acs.cgd.9b01112

Verlag: American Chemical Society

Abstract: 
Yttria-stabilized zirconia (YSZ) is a well-known solid electrolyte material in high-temperature applications that involve the conduction of oxygen ions. One possible way of enhancing the performance of devices like solid oxide fuel cells at lower operation temperatures is the design of the electrolyte's surface by increasing the surface area and modifying the surface properties by ceria coating to improve the oxygen incorporation reaction. However, the preparation of a conformal coating while maintaining a complex surface morphology on the nanoscale is challenging employing conventional evaporation methods. In this work we present thin ceria coatings (9-20 nm) that were deposited on porous 8 mol % YSZ thin films using atomic layer deposition (ALD). The YSZ films (with thicknesses between 90 and 130 nm) were prepared using pulsed laser deposition at various substrate temperatures, thus leading to different surface morphologies. The investigation of the sample cross section by high angle annular dark field transmission electron microscopy exhibits columnar growth of epitaxial grown ceria thin films with excellent coating conformity. This demonstrates the great potential of the ALD process for surface modification of porous materials, where controlled and conformal coating of high surface areas is desired.

Harvard-Zitierstil: Zscherp, M., Glaser, J., Becker, C., Beyer, A., Cop, P., Schoermann, J., et al. (2020) Epitaxial Growth and Structural Characterization of Ceria Deposited by Atomic Layer Deposition on High-Surface Porous Yttria-Stabilized Zirconia Thin Films, Crystal Growth and Design, 20(4), pp. 2194-2201. https://doi.org/10.1021/acs.cgd.9b01112

APA-Zitierstil: Zscherp, M., Glaser, J., Becker, C., Beyer, A., Cop, P., Schoermann, J., Volz, K., & Elm, M. (2020). Epitaxial Growth and Structural Characterization of Ceria Deposited by Atomic Layer Deposition on High-Surface Porous Yttria-Stabilized Zirconia Thin Films. Crystal Growth and Design. 20(4), 2194-2201. https://doi.org/10.1021/acs.cgd.9b01112