Journalartikel

Jahr der Veröffentlichung: 2020

Seiten: 191-204

Zeitschrift: Engineering Research

Bandnummer: 84

Heftnummer: 2

ISSN: 0015-7899

eISSN: 1434-0860

Open Access Status: Hybrid

DOI Link: https://doi.org/10.1007/s10010-020-00399-x

Verlag: Springer

Abstract: 
The drive train of electric vehicles differs significantly from that of vehicles with internal combustion engines. Typically, there is no clutch integrated, with a small number of gears the friction and damping is reduced. A main problem are oscillations caused by internal (torque changes of the electric motor, brake interventions) and external excitation (road unevenness, potholes, etc.). Oscillation damping methods are required in order to reduce oscillations in the drive train and thus component loads. The aim here is to increase driving comfort without causing major losses in vehicle dynamics. This article describes investigations of the dynamic behavior of an electric vehicle drive train on a hardware-in-the-loop (HiL) test bench. Internal excitations caused by torque changes of the electric machine during driving off are considered. The influences of different resolutions of the rotor position encoder of the electric machine on the active oscillation damping are investigated. With the introduction of an observer for the oscillation behavior of the drive train, an optimization in the case of low-resolution rotor position sensors is finally carried out.

Harvard-Zitierstil: Koch, A., Schulz, L., Jakstas, G. and Falkenstein, J. (2020) Investigation and optimization of the influence of low-resolution rotor position encoders on the drivability functions of electrified vehicle drive systems by means of a hardware-in-the-loop test bench, Engineering Research, 84(2), pp. 191-204. https://doi.org/10.1007/s10010-020-00399-x

APA-Zitierstil: Koch, A., Schulz, L., Jakstas, G., & Falkenstein, J. (2020). Investigation and optimization of the influence of low-resolution rotor position encoders on the drivability functions of electrified vehicle drive systems by means of a hardware-in-the-loop test bench. Engineering Research. 84(2), 191-204. https://doi.org/10.1007/s10010-020-00399-x