Journal article

Modeling Responses and Response Times in Tests With the Hierarchical Model and the Three-Parameter Lognormal Distribution


Authors listRanger, Jochen; Kuhn, Joerg Tobias; Ortner, Tuulia M.

Publication year2020

Pages1059-1089

JournalEducational and Psychological Measurement

Volume number80

Issue number6

ISSN0013-1644

eISSN1552-3888

Open access statusGreen

DOI Linkhttps://doi.org/10.1177/0013164420908916

PublisherSAGE Publications


Abstract
The hierarchical model of van der Linden is the most popular model for responses and response times in tests. It is composed of two separate submodels-one for the responses and one for the response times-that are joined at a higher level. The submodel for the response times is based on the lognormal distribution. The lognormal distribution is a skew distribution with a support from zero to infinity. Such a support is unrealistic as the solution process demands a minimal processing time that sets a response time threshold. Ignoring this response time threshold misspecifies the model and threatens the validity of model-based inferences. In this article, the response time model of van der Linden is replaced by a model that is based on the three-parameter lognormal distribution. The three-parameter lognormal distribution extends the lognormal distribution by an additional location parameter that bounds the support away from zero. Two different approaches to model fitting are proposed and evaluated with regard to parameter recovery in a simulation study. The extended model is applied to two data sets. In both data sets, the extension improves the fit of the hierarchical model.



Citation Styles

Harvard Citation styleRanger, J., Kuhn, J. and Ortner, T. (2020) Modeling Responses and Response Times in Tests With the Hierarchical Model and the Three-Parameter Lognormal Distribution, Educational and Psychological Measurement, 80(6), Article 0013164420908916. pp. 1059-1089. https://doi.org/10.1177/0013164420908916

APA Citation styleRanger, J., Kuhn, J., & Ortner, T. (2020). Modeling Responses and Response Times in Tests With the Hierarchical Model and the Three-Parameter Lognormal Distribution. Educational and Psychological Measurement. 80(6), Article 0013164420908916, 1059-1089. https://doi.org/10.1177/0013164420908916



Keywords


ABERRANT BEHAVIORESTIMATING PARAMETERShierarchical modelMAXIMUM-LIKELIHOOD-ESTIMATIONnondecision timethree-parameter lognormal distribution

Last updated on 2025-10-06 at 11:10