Journal article

Modelling radiation damage to pixel sensors in the ATLAS detector


Authors listAaboud, M.; Aad, G.; Abbott, B.; Abbott, D. C.; Abdinov, O.; Abhayasinghe, D. K.; Abidi, S. H.; AbouZeid, O. S.; Abraham, N. L.; Abramowicz, H.; Abreu, H.; Abulaiti, Y.; Acharya, B. S.; Adachi, S.; Adam, L.; Bourdarios, C. Adam; Adamczyk, L.; Adamek, L.; Adelman, J.; Adersberger, M.; Adiguzel, A.; Adye, T.; Affolder, A. A.; Afik, Y.; Agapopoulou, C.; Agaras, M. N.; Aggarwal, A.; Agheorghiesei, C.; Aguilar-Saavedra, J. A.; Ahmadov, F.; Aielli, G.; Akatsuka, S.; Akesson, T. P. A.; Akilli, E.; Akimov, A., V; Al Khoury, K.; Alberghi, G. L.; Albert, J.; Alconada Verzini, M. J.; Alderweireldt, S.; Aleksa, M.; Aleksandrov, I. N.; Alexa, C.; Alexandre, D.; Alexopoulos, T.; Alhroob, M.; Ali, B.; Alimonti, G.; Alison, J.; Alkire, S. P.; Allaire, C.; Allbrooke, B. M. M.; Allen, B. W.; Allport, P. P.; Aloisio, A.; Alonso, A.; Alonso, F.; Alpigiani, C.; Alshehri, A. A.; Alstaty, M., I; Alvarez Estevez, M.; Gonzalez, B. Alvarez; Alvarez Piqueras, D.; Alviggi, M. G.; Amaral Coutinho, Y.; Ambler, A.; Ambroz, L.; Amelung, C.; Amidei, D.; Amor Dos Santos, S. P.; Amoroso, S.; Amrouche, C. S.; An, F.; Anastopoulos, C.; Andari, N.; Andeen, T.; Anders, C. F.; Anders, J. K.; Andreazza, A.; Andrei, V; Anelli, C. R.; Angelidakis, S.; Angelozzi, I; Angerami, A.; Anisenkov, A., V; Annovi, A.; Antel, C.; Anthony, M. T.; Antonelli, M.; Antrim, D. J. A.; Anulli, F.; Aoki, M.; Aparisi Pozo, J. A.; Bella, L. Aperio; Arabidze, G.; Araque, J. P.; Araujo Ferraz, V; Araujo Pereira, R.; Arce, A. T. H.; Arduh, F. A.; Arguin, J-F; Argyropoulos, S.; Arling, J-H; Armbruster, A. J.; Armitage, L. J.; Armstrong, A.; Arnaez, O.; Arnold, H.; Artamonov, A.; Artoni, G.; Artz, S.; Asai, S.; Asbah, N.; Asimakopoulou, E. M.; Asquith, L.; Assamagan, K.; Astalos, R.; Atkin, R. J.; Atkinson, M.; Atlay, N. B.; Augsten, K.; Avolio, G.; Avramidou, R.; Ayoub, M. K.; Azoulay, A. M.; Azuelos, G.; Baas, A. E.; Baca, M. J.; Bachacou, H.; Bachas, K.; Backes, M.; Backman, F.; Bagnaia, P.; Bahmani, M.; Bahrasemani, H.; Bailey, A. J.; Bailey, V. R.; Baines, J. T.; Bajic, M.; Bakalis, C.; Baker, O. K.; Bakker, P. J.; Gupta, D. Bakshi; Balaji, S.; Baldin, E. M.; Balek, P.; Balli, F.; Balunas, W. K.; Balz, J.; Banas, E.; Bandyopadhyay, A.; Banerjee, Sw; Bannoura, A. A. E.; Barak, L.; Barbe, W. M.; Barberio, E. L.; Barberis, D.; Barbero, M.; Barillari, T.; Barisits, M-S; Barkeloo, J.; Barklow, T.; Barnea, R.; Barnes, S. L.; Barnett, B. M.; Barnett, R. M.; Barnovska-Blenessy, Z.; Baroncelli, A.; Barone, G.; Barr, A. J.; Barranco Navarro, L.; Barreiro, F.; da Costa, J. Barreiro Guimaraes; Bartoldus, R.; Bartolini, G.; Barton, A. E.; Bartos, P.; Basalaev, A.; Bassalat, A.; Bates, R. L.; Batista, S. J.; Batlamous, S.; Batley, J. R.; Battaglia, M.; Bauce, M.; Bauer, F.; Bauer, K. T.; Bawa, H. S.; Beacham, J. B.; Beau, T.; Beauchemin, P. H.; Bechtle, P.; Beck, H. C.; Beck, H. P.; Becker, K.; Becker, M.; Becot, C.; Beddall, A.; Beddall, A. J.; Bednyakov, V. A.; Bedognetti, M.; Bee, C. P.; Beermann, T. A.; Begalli, M.; Begel, M.; Behera, A.; Behr, J. K.; Beisiegel, F.; Bell, A. S.; Bella, G.; Bellagamba, L.; Bellerive, A.; Bellos, P.; Beloborodov, K.; Belotskiy, K.; Belyaev, N. L.; Benary, O.; Benchekroun, D.; Benekos, N.; Benhammou, Y.; Benjamin, D. P.; Benoit, M.; Bensinger, J. R.; Bentvelsen, S.; Beresford, L.; Beretta, M.; Berge, D.; Kuutmann, E. Bergeaas; Berger, N.; Bergmann, B.; Bergsten, L. J.; Beringer, J.; Berlendis, S.; Bernard, N. R.; Bernardi, G.; Bernius, C.; Bernlochner, F. U.; Berry, T.; Berta, P.; Bertella, C.; Bertoli, G.; Bertram, I. A.; Besjes, G. J.; Bylund, O. Bessidskaia; Besson, N.; Bethani, A.; Bethke, S.; Betti, A.; Bevan, A. J.; Beyer, J.; Bi, R.; Bianchi, R. M.; Biebel, O.; Biedermann, D.; Bielski, R.; Bierwagen, K.; Biesuz, N., V; Biglietti, M.; Billoud, T. R., V; Bindi, M.; Bingul, A.; Bini, C.; Biondi, S.; Birman, M.; Bisanz, T.; Biswal, J. P.; Bitadze, A.; Bittrich, C.; Bjergaard, D. M.; Black, J. E.; Black, K. M.; Blazek,

Publication year2019

JournalJournal of Instrumentation

Volume number14

ISSN1748-0221

DOI Linkhttps://doi.org/10.1088/1748-0221/14/06/P06012

PublisherIOP Publishing


Abstract
Silicon pixel detectors are at the core of the current and planned upgrade of the ATLAS experiment at the LHC. Given their close proximity to the interaction point, these detectors will be exposed to an unprecedented amount of radiation over their lifetime. The current pixel detector will receive damage from non-ionizing radiation in excess of 10(15) 1 MeV n(eq)/cm(2), while the pixel detector designed for the high-luminosity LHC must cope with an order of magnitude larger fluence. This paper presents a digitization model incorporating effects of radiation damage to the pixel sensors. The model is described in detail and predictions for the charge collection efficiency and Lorentz angle are compared with collision data collected between 2015 and 2017 (<= 10(15) 1 MeV n(eq)/cm(2)).



Citation Styles

Harvard Citation styleAaboud, M., Aad, G., Abbott, B., Abbott, D., Abdinov, O., Abhayasinghe, D., et al. (2019) Modelling radiation damage to pixel sensors in the ATLAS detector, Journal of Instrumentation, 14, Article P06012. https://doi.org/10.1088/1748-0221/14/06/P06012

APA Citation styleAaboud, M., Aad, G., Abbott, B., Abbott, D., Abdinov, O., Abhayasinghe, D., Abidi, S., AbouZeid, O., Abraham, N., Abramowicz, H., Abreu, H., Abulaiti, Y., Acharya, B., Adachi, S., Adam, L., Bourdarios, C., Adamczyk, L., Adamek, L., Adelman, J., ...Blazek, (2019). Modelling radiation damage to pixel sensors in the ATLAS detector. Journal of Instrumentation. 14, Article P06012. https://doi.org/10.1088/1748-0221/14/06/P06012



Keywords


Detector modelling and simulations II (electric fields, charge transport, multiplication and induction, pulse formation, electron emission, etc)Radiation-hard detectorsSilicon detectorsSolid state detectorsTRAPPING TIME

Last updated on 2025-02-04 at 01:04