Journalartikel

Optical Analysis of Oxygen Self-Diffusion in Ultrathin CeO2 Layers at Low Temperatures


AutorenlisteNeuderth, Paula; Hille, Pascal; Marti-Sanchez, Sara; de la Mata, Maria; Coll, Mariona; Arbiol, Jordi; Eickhoff, Martin

Jahr der Veröffentlichung2018

ZeitschriftAdvanced Energy Materials

Bandnummer8

Heftnummer29

ISSN1614-6832

eISSN1614-6840

Open Access StatusGreen

DOI Linkhttps://doi.org/10.1002/aenm.201802120

VerlagWiley


Abstract
An optical in situ strategy for the analysis of oxygen diffusion in ultrathin ceria layers with a thickness of 2-10 nm at temperatures between 50 and 200 degrees C is presented, which allows for the determination of diffusion coefficients. This method is based on the sensitivity of the photoluminescence (PL) intensity of InGaN nanowires to adsorbed oxygen. The oxygen diffusion through an ultrathin CeO2 coating deposited on the InGaN nanowires is monitored by analyzing the transient PL behavior of the InGaN nanowires, which responds to changes of the oxygen concentration in the environment when the corresponding oxygen concentration is established at the CeO2/InGaN interface due to diffusion through the coating. Quantitative evaluation of the oxygen diffusion in CeO2 based on a model considering Langmuir Adsorption and recombination yields a diffusion coefficient D of (2.55 +/- 0.05) x 10(-16) cm(2) s(-1) at a temperature of 100 degrees C. Temperature-dependent measurements reveal an Arrhenius type behavior of D with an activation energy of (0.28 +/- 0.04) eV. In contrast, no oxygen diffusion is detected for an ultrathin layer (5 nm) of Al2O3, which is known as a poor oxygen ion conductor within the analyzed temperature regime.



Zitierstile

Harvard-ZitierstilNeuderth, P., Hille, P., Marti-Sanchez, S., de la Mata, M., Coll, M., Arbiol, J., et al. (2018) Optical Analysis of Oxygen Self-Diffusion in Ultrathin CeO2 Layers at Low Temperatures, Advanced Energy Materials, 8(29), Article 1802120. https://doi.org/10.1002/aenm.201802120

APA-ZitierstilNeuderth, P., Hille, P., Marti-Sanchez, S., de la Mata, M., Coll, M., Arbiol, J., & Eickhoff, M. (2018). Optical Analysis of Oxygen Self-Diffusion in Ultrathin CeO2 Layers at Low Temperatures. Advanced Energy Materials. 8(29), Article 1802120. https://doi.org/10.1002/aenm.201802120



Schlagwörter


InGaN nanowiresMOLECULAR-DYNAMICSnanophotonic chemical sensorsSURFACE EXCHANGE


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