Journal article
Authors list: Peterseim, Tobias; Dressel, Martin; Dietrich, Marc; Polity, Angelika
Publication year: 2016
Journal: Journal of Applied Physics
Volume number: 120
Issue number: 7
ISSN: 0021-8979
eISSN: 1089-7550
Open access status: Green
DOI Link: https://doi.org/10.1063/1.4961406
Publisher: American Institute of Physics
Abstract:
Thin films of VO2 on different substrates, Al2O3 and SiO2/Si, have been prepared and characterized from room temperature up to 360 K. From the band structure in the rutile metallic phase and in the monoclinic insulating phase, the optical properties are calculated and compared with reflection measurements performed as a function of temperatures. Various interband transitions can be assigned and compared with previous speculations. We extract the parameters of the metallic charge carriers that evolve upon crossing the insulator-to-metal phase transition and find effects by the substrate. The influence of electronic correlations becomes obvious at the phase transition. Published by AIP Publishing.
Citation Styles
Harvard Citation style: Peterseim, T., Dressel, M., Dietrich, M. and Polity, A. (2016) Optical properties of VO2 films at the phase transition: Influence of substrate and electronic correlations, Journal of Applied Physics, 120(7), Article 075102. https://doi.org/10.1063/1.4961406
APA Citation style: Peterseim, T., Dressel, M., Dietrich, M., & Polity, A. (2016). Optical properties of VO2 films at the phase transition: Influence of substrate and electronic correlations. Journal of Applied Physics. 120(7), Article 075102. https://doi.org/10.1063/1.4961406
Keywords
BAND THEORY; METAL-INSULATOR TRANSITIONS; MOTT-HUBBARD; PEIERLS; vanadium dioxide; VIEW