Journalartikel

Jahr der Veröffentlichung: 2014

Seiten: 615-619

Zeitschrift: Nuclear Instruments and Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Bandnummer: 735

ISSN: 0168-9002

eISSN: 1872-9576

DOI Link: https://doi.org/10.1016/j.nima.2013.10.022

Verlag: Elsevier

Abstract: 
We present a fast, analytical method to calculate the threshold and noise parameters from a threshold scan. This is usually done by fitting a response function to the data which is computationally very intensive. The runtime can be minimized by a hardware implementation, e.g. using an FPGA, which in turn requires to minimize the mathematical complexity of the algorithm in order to fit into the available resources on the FPGA. The systematic errors of the method are analyzed and reasonable choices of the parameters for use in practice are given. (C) 2013 Elsevier B.V. All rights reserved

Harvard-Zitierstil: Mertens, M. and Ritman, J. (2014) A method for fast feature extraction in threshold scans, Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 735, pp. 615-619. https://doi.org/10.1016/j.nima.2013.10.022

APA-Zitierstil: Mertens, M., & Ritman, J. (2014). A method for fast feature extraction in threshold scans. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 735, 615-619. https://doi.org/10.1016/j.nima.2013.10.022