Journal article

Publication year: 2012

Pages: 977-984

Journal: Journal of Porphyrins and Phthalocyanines

Volume number: 16

Issue number: 7-8

ISSN: 1088-4246

DOI Link: https://doi.org/10.1142/S1088424612501064

Publisher: World Scientific Publishing

Abstract: 
Thin films from the monolayer range to the thickness of 40 nm of the perfluorinated copper phthalocyanine (F16PcCu) were prepared by physical vapor deposition on freshly cleaved (001) faces of the alkali halides NaCl, KCl and KBr. The different lattice constants of the substrates provided sufficient difference to trigger the growth of differently ordered phases of F16PcCu. Electron diffraction, Atomic Force Microscopy and UV-vis spectroscopy were used to characterize the structure for F16PcCu monolayers and for films of increasing average film thickness towards bulk films. A square lattice of flat-lying F16PcCu is proposed for the first monolayers. In the bulk films, phases already described for F16PcCu on other substrates were formed, but also a new phase was discovered.

Harvard Citation style: Lorenz, E., Keil, C. and Schlettwein, D. (2012) Structure and morphology in thin films of perfluorinated copper phthalocyanine grown on alkali halide surfaces (001), Journal of Porphyrins and Phthalocyanines, 16(7-8), pp. 977-984. https://doi.org/10.1142/S1088424612501064

APA Citation style: Lorenz, E., Keil, C., & Schlettwein, D. (2012). Structure and morphology in thin films of perfluorinated copper phthalocyanine grown on alkali halide surfaces (001). Journal of Porphyrins and Phthalocyanines. 16(7-8), 977-984. https://doi.org/10.1142/S1088424612501064