Journal article

Statistical properties and economic implications of jump-diffusion processes with shot-noise effects


Authors listMoreno, Manuel; Serrano, Pedro; Stute, Winfried

Publication year2011

Pages656-664

JournalEuropean Journal of Operational Research

Volume number214

Issue number3

ISSN0377-2217

eISSN1872-6860

Open access statusGreen

DOI Linkhttps://doi.org/10.1016/j.ejor.2011.05.011

PublisherElsevier


Abstract
The shot-noise jump-diffusion (SNJD) model aims to reflect how economic variables respond to the arrival of sudden information. This paper analyzes the SNJD model, providing its statistical distribution and closed-form expressions for the characteristic function and moments. We also analyze the dynamics of the model, concluding that the degree of serial autocorrelation is related to the occurrence and magnitude of abnormal information. In addition, we provide some useful approximations in a particular case that considers exponential-type decay. Empirically, we propose a GMM approach to estimate the parameters of the model and present an empirical application for the stocks included in the Dow Jones Averaged Index. Our findings seem to confirm the presence of shot-noise effects in 73% of the stocks and a strong relationship between the shot-noise process and the autocorrelation pattern embedded in data. (C) 2011 Elsevier B.V. All rights reserved.



Citation Styles

Harvard Citation styleMoreno, M., Serrano, P. and Stute, W. (2011) Statistical properties and economic implications of jump-diffusion processes with shot-noise effects, European Journal of Operational Research, 214(3), pp. 656-664. https://doi.org/10.1016/j.ejor.2011.05.011

APA Citation styleMoreno, M., Serrano, P., & Stute, W. (2011). Statistical properties and economic implications of jump-diffusion processes with shot-noise effects. European Journal of Operational Research. 214(3), 656-664. https://doi.org/10.1016/j.ejor.2011.05.011



Keywords


Characteristic functionGeneralized method of momentsRETURNSShot-noiseSTOCHASTIC VOLATILITY

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