Conference paper

Multi-reflection time-of-flight mass spectrograph for short-lived radioactive ions


Authors listSchury, P.; Okada, K.; Shchepunov, S.; Sonoda, T.; Takamine, A.; Wada, M.; Wollnik, H.; Yamazaki, Y.

Publication year2009

Pages343-349

JournalThe European Physical Journal A

Volume number42

Issue number3

ISSN1434-6001

eISSN1434-601X

DOI Linkhttps://doi.org/10.1140/epja/i2009-10882-6

Conference5th International Conference on Exotic Nuclei and Atomic Masses (ENAM'08)

PublisherSpringer


Abstract
RIKEN's new RI-Beam Factory (RIBF) will provide unprecedented access to neutron-rich nuclei of importance to r-process nucleosynthesis. We are constructing an advanced multi-reflection time-of-flight mass spectrograph to perform precision mass measurements of these nuclei. We discuss the device and compare its performance to that of the well-known Penning trap mass spectrometer.



Citation Styles

Harvard Citation styleSchury, P., Okada, K., Shchepunov, S., Sonoda, T., Takamine, A., Wada, M., et al. (2009) Multi-reflection time-of-flight mass spectrograph for short-lived radioactive ions, The European Physical Journal A, 42(3), pp. 343-349. https://doi.org/10.1140/epja/i2009-10882-6

APA Citation styleSchury, P., Okada, K., Shchepunov, S., Sonoda, T., Takamine, A., Wada, M., Wollnik, H., & Yamazaki, Y. (2009). Multi-reflection time-of-flight mass spectrograph for short-lived radioactive ions. The European Physical Journal A. 42(3), 343-349. https://doi.org/10.1140/epja/i2009-10882-6



Keywords


BEAMS

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