Journalartikel

Jahr der Veröffentlichung: 2005

Seiten: 2015-2028

Zeitschrift: Journal of Physics B: Atomic, Molecular and Optical Physics

Bandnummer: 38

Heftnummer: 12

ISSN: 0953-4075

eISSN: 1361-6455

DOI Link: https://doi.org/10.1088/0953-4075/38/12/015

Verlag: IOP Publishing

Abstract: 
Electron-impact n-fold (n = 2-5) ionization of Sc+ ions has been studied covering an energy range from threshold to 1000 eV An electron-ion crossed-beams set-up was employed for the measurement of absolute cross sections as well as for high-resolution energy-scans by which fine details in the energy dependence of the cross section could be uncovered. Contributions of indirect resonant and non-resonant processes to the partial ionization cross sections such as excitation or ionization of an inner shell electron with subsequent autoionization processes have been observed.

Harvard-Zitierstil: Jacobi, J., Knopp, H., Schippers, S., Shi, W. and Müller, A. (2005) Multiple ionization of Sc+-ions by electron impact, Journal of Physics B: Atomic, Molecular and Optical Physics, 38(12), pp. 2015-2028. https://doi.org/10.1088/0953-4075/38/12/015

APA-Zitierstil: Jacobi, J., Knopp, H., Schippers, S., Shi, W., & Müller, A. (2005). Multiple ionization of Sc+-ions by electron impact. Journal of Physics B: Atomic, Molecular and Optical Physics. 38(12), 2015-2028. https://doi.org/10.1088/0953-4075/38/12/015