Konferenzpaper

Jahr der Veröffentlichung: 2003

Seiten: 410-412

Zeitschrift: Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms

Bandnummer: 205

ISSN: 0168-583X

DOI Link: https://doi.org/10.1016/S0168-583X(02)02043-8

Konferenz: 11th International Conference on the Physics of Highly Charged Ions (HCI 2002)

Verlag: Elsevier

Abstract: 
The absolute electron-impact ionization cross section of Sc+ ions was measured by employing the crossed beams technique. We find pronounced contributions (up to similar to30%) of indirect processes to the total ionization cross section. This finding is related to the existence of exceptionally strong 3p --> 3d excitation channels in Sc+(3p(6)3d4s). (C) 2003 Elsevier Science B.V. All rights reserved.

Harvard-Zitierstil: Jacobi, J., Knopp, H., Schippers, S., Shi, W. and Müller, A. (2003) Strong contributions of indirect processes to the electron-impact ionization cross section of Sc+ ions, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 205, pp. 410-412. https://doi.org/10.1016/S0168-583X(02)02043-8

APA-Zitierstil: Jacobi, J., Knopp, H., Schippers, S., Shi, W., & Müller, A. (2003). Strong contributions of indirect processes to the electron-impact ionization cross section of Sc+ ions. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 205, 410-412. https://doi.org/10.1016/S0168-583X(02)02043-8