Journalartikel

Influence of electromagnetic fields on the dielectronic recombination of Ne7+ ions


AutorenlisteBöhm, S; Schippers, S; Shi, W; Müller, A; Djuric, N; Dunn, GH; Zong, W; Jelenkovic, B; Danared, H; Eklöw, N; Glans, P; Schuch, R

Jahr der Veröffentlichung2001

ZeitschriftPhysical review A

Bandnummer64

Heftnummer3

ISSN2469-9926

eISSN2469-9934

DOI Linkhttps://doi.org/10.1103/PhysRevA.64.032707

VerlagAmerican Physical Society


Abstract
The influence of crossed electric and magnetic fields on dielectronic recombination of Ne7+ ions has been measured at the Stockholm heavy-ion storage ring CRYRING. The electron energy range covered all dielectronic recombination resonances attached to 2s --> 2p(1/2) and 2s --> 2p(3/2) Deltan=0 core excitations, Two sets of measurements at magnetic fields of 180 mT and 30 mT have been per-formed. For the measurement at 180 mT we applied 25 different electric fields between 0 and 1400 V/cm. The resonance strength for dielectronic recombination via high Rydberg states initially increases linearly with electric field and later levels out. At a magnetic field of 30 mT we applied 15 different electric fields ranging from 0 to 140 V/cm. Compared to the measurement at 180 mT the initial slope of the rate enhancement was larger by almost a factor of 2. The fraction of resonant strength not measured due to field ionization is estimated by a model calculation of dielectronic recombination cross sections.



Zitierstile

Harvard-ZitierstilBöhm, S., Schippers, S., Shi, W., Müller, A., Djuric, N., Dunn, G., et al. (2001) Influence of electromagnetic fields on the dielectronic recombination of Ne7+ ions, Physical review A, 64(3), Article 032707. https://doi.org/10.1103/PhysRevA.64.032707

APA-ZitierstilBöhm, S., Schippers, S., Shi, W., Müller, A., Djuric, N., Dunn, G., Zong, W., Jelenkovic, B., Danared, H., Eklöw, N., Glans, P., & Schuch, R. (2001). Influence of electromagnetic fields on the dielectronic recombination of Ne7+ ions. Physical review A. 64(3), Article 032707. https://doi.org/10.1103/PhysRevA.64.032707



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ELECTRON


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