Journal article

Publication year: 2001

Pages: 620-623

Journal: Physical Review Letters

Volume number: 86

Issue number: 4

ISSN: 0031-9007

DOI Link: https://doi.org/10.1103/PhysRevLett.86.620

Publisher: American Physical Society

Abstract: 
Experimental measurements and theoretical calculations are carried out far the electron-impact ionization of Sm12+. The low energy region of the single ionization cross section for Sm12+ is found to be dominated by contributions from the indirect process of excitation autoionization. At about 1.0 keV strong resonance features are found in the experimental crossed-beam measurements performed in scan mode at high resolution. Theoretical calculations confirm that the high energy experimental features are due to deep-core dielectronic capture followed by sequential double Auger decay. The discovery of these unusual high energy resonances in single and multiple ionization opens the deter for future systematic studies of how heavy atomic ions with deep inner-shell vacancies achieve final stabilization.

Harvard Citation style: Aichele, K., Hathiramani, D., Scheuermann, F., Müller, A., Salzborn, E., Mitnik, D., et al. (2001) Deep-core dielectronic-capture resonances in the electron-impact ionization of heavy atomic ions, Physical Review Letters, 86(4), pp. 620-623. https://doi.org/10.1103/PhysRevLett.86.620

APA Citation style: Aichele, K., Hathiramani, D., Scheuermann, F., Müller, A., Salzborn, E., Mitnik, D., Colgan, J., & Pindzola, M. (2001). Deep-core dielectronic-capture resonances in the electron-impact ionization of heavy atomic ions. Physical Review Letters. 86(4), 620-623. https://doi.org/10.1103/PhysRevLett.86.620