Konferenzpaper

Jahr der Veröffentlichung: 2017

Zeitschrift: Journal of Physics: Conference Series

Bandnummer: 875

DOI Link: https://doi.org/10.1088/1742-6596/875/6/052048

Konferenz: 30th International Conference on Photonic, Electronic, and Atomic Collisions (ICPEAC2017)

Verlag: IOP Publishing: Conference Series

Abstract: 

The cross section for electron-impact single ionization of Xe²⁴⁺ has been studied both experimentally and theoretically. The cross section exhibits significant features from resonant ionization processes such as resonant-excitation double autoionization. These are well described by the theoretical calculations if the latter take into account excitations to atomic shells with principal quantum numbers of up to n = 39.

Harvard-Zitierstil: Liu, P., Zeng, J., Borovik, A., Schippers, S. and Müller, A. (2017) Prominent role of indirect processes in electron-impact ionization of Xe24+ ions, Journal of Physics: Conference Series, 875, Article 052048. https://doi.org/10.1088/1742-6596/875/6/052048

APA-Zitierstil: Liu, P., Zeng, J., Borovik, A., Schippers, S., & Müller, A. (2017). Prominent role of indirect processes in electron-impact ionization of Xe24+ ions. Journal of Physics: Conference Series. 875, Article 052048. https://doi.org/10.1088/1742-6596/875/6/052048