Konferenzpaper

Jahr der Veröffentlichung: 2012

Zeitschrift: Journal of Physics: Conference Series

Bandnummer: 388

DOI Link: https://doi.org/10.1088/1742-6596/388/6/062024

Konferenz: 27th International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2011)

Verlag: IOP Publishing: Conference Series

Abstract: 

A systematic study of electron-impact single- and multiple-ionization cross sections of Xe^q+ ions (q = 1, ..., 25) in the energy range up to 1000 eV is reported. Detailed analysis of the overall 53 measured cross-section functions revealed that indirect ionization mechanisms dominate ionization of most of the investigated ions.

Harvard-Zitierstil: Borovik, A., Rausch, J., Rudolph, J., Gharaibeh, M., Schippers, S. and Müller, A. (2012) Electron-impact single and multiple ionization of xenon ions, Journal of Physics: Conference Series, 388, Article 062024. https://doi.org/10.1088/1742-6596/388/6/062024

APA-Zitierstil: Borovik, A., Rausch, J., Rudolph, J., Gharaibeh, M., Schippers, S., & Müller, A. (2012). Electron-impact single and multiple ionization of xenon ions. Journal of Physics: Conference Series. 388, Article 062024. https://doi.org/10.1088/1742-6596/388/6/062024