Conference paper
Authors list: Becker, A; Spruck, K; Borovik, A; Schippers, S; Müller, A
Publication year: 2012
Journal: Journal of Physics: Conference Series
Volume number: 388
DOI Link: https://doi.org/10.1088/1742-6596/388/6/062027
Conference: 27th International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2011)
Publisher: IOP Publishing: Conference Series
Electron-impact single-ionization cross sections of Ar6+ ions have been measured in the energy region from below 14 eV up to 1000 eV. Strong contributions of indirect-ionization processes involving excitation of the 2p subshell have been observed. Ions in long-lived excited states were present in the primary ion beam and resulted in ionization onsets below the ground-state ionization threshold.
Abstract:
Citation Styles
Harvard Citation style: Becker, A., Spruck, K., Borovik, A., Schippers, S. and Müller, A. (2012) Electron-impact single-ionization of Ar6+ ions, Journal of Physics: Conference Series, 388, Article 062027. https://doi.org/10.1088/1742-6596/388/6/062027
APA Citation style: Becker, A., Spruck, K., Borovik, A., Schippers, S., & Müller, A. (2012). Electron-impact single-ionization of Ar6+ ions. Journal of Physics: Conference Series. 388, Article 062027. https://doi.org/10.1088/1742-6596/388/6/062027
