Konferenzpaper

Jahr der Veröffentlichung: 2012

Zeitschrift: Journal of Physics: Conference Series

Bandnummer: 388

DOI Link: https://doi.org/10.1088/1742-6596/388/6/062026

Konferenz: 27th International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2011)

Verlag: IOP Publishing: Conference Series

Abstract: 

Electron-impact single-ionization cross sections of Ar⁵⁺ ions have been measured employing the crossed-beams technique. In the comparison with former experimental data sets significant discrepancies became apparent. In the energy region from 240 eV up to 300 eV strong contributions from indirect-ionization processes involving excitation of the 2p subshell were observed.

Harvard-Zitierstil: Spruck, K., Becker, A., Borovik, A., Schippers, S. and Müller, A. (2012) Electron-impact single-ionization of Ar5+ ions, Journal of Physics: Conference Series, 388, Article 062026. https://doi.org/10.1088/1742-6596/388/6/062026

APA-Zitierstil: Spruck, K., Becker, A., Borovik, A., Schippers, S., & Müller, A. (2012). Electron-impact single-ionization of Ar5+ ions. Journal of Physics: Conference Series. 388, Article 062026. https://doi.org/10.1088/1742-6596/388/6/062026