Konferenzpaper

Jahr der Veröffentlichung: 2009

Zeitschrift: Journal of Physics: Conference Series

Bandnummer: 194

DOI Link: https://doi.org/10.1088/1742-6596/194/6/062014

Konferenz: 26th International Conference on Photonic, Electronic and Atomic Collisions

Verlag: IOP Publishing: Conference Series

Abstract: 

We report on a comprehensive study of electron-impact single and multiple ionization of Xe^q+ ions (q = 1, 2, ...,25) at energies from the observed thresholds up to 1000 eV. Special emphasis is on indirect processes and their contributions to the net ionization of the parent ion. Although this work is still in progress, it is clear that indirect processes dominate the cross sections. This is demonstrated for the example of single ionization of Xe²²⁺ ions.

Harvard-Zitierstil: Borovik, A., Rausch, J., Rudolph, J., Gharaibeh, M., Schippers, S. and Müller, A. (2009) Electron impact ionization of xenon ions, Journal of Physics: Conference Series, 194, Article 062014. https://doi.org/10.1088/1742-6596/194/6/062014

APA-Zitierstil: Borovik, A., Rausch, J., Rudolph, J., Gharaibeh, M., Schippers, S., & Müller, A. (2009). Electron impact ionization of xenon ions. Journal of Physics: Conference Series. 194, Article 062014. https://doi.org/10.1088/1742-6596/194/6/062014