Konferenzpaper

Erschienen in: Electron Cyclotron Resonance Ion Sources. 16th International Workshop on ECR Ion Sources

Herausgeberliste: Leitner, Matthaeus

Jahr der Veröffentlichung: 2005

Seiten: 88-91

ISBN: 0-7354-0234.5

DOI Link: https://doi.org/10.1063/1.1893373

Konferenz: 16th International Workshop on ECR Ion Sources (ECRIS '04)

Serientitel: AIP conference proceedings

Serienzählung: 749

Abstract: 

Photoionization of multiply charged ions is studied using the merged‐beams technique at the Advanced Light Source. An ion beam is created using a compact 10‐GHz all‐permanent‐magnet ECR ion source and is accelerated with a small accelerator. The ion beam is merged with a photon beam from an undulator to allow interaction over an extended path. Absolute photoionization cross sections have been measured for a variety of ions along both isoelectronic and isonuclear sequences.

Harvard-Zitierstil: Schlachter, A., Kilcoyne, A., Aguilar, A., Gharaibeh, M., Emmons, E., Scully, S., et al. (2005) Photoionization of Multiply Charged Ions at the Advanced Light Source, in Leitner, M. (ed.) Electron Cyclotron Resonance Ion Sources. 16th International Workshop on ECR Ion Sources. New York, NY: American Institute of Physics. pp. 88-91. https://doi.org/10.1063/1.1893373

APA-Zitierstil: Schlachter, A., Kilcoyne, A., Aguilar, A., Gharaibeh, M., Emmons, E., Scully, S., Phaneuf, R., Müller, A., Schippers, S., Alvarez, I., Cisneros, C., Hinojosa, G., & McLaughlin, B. (2005). Photoionization of Multiply Charged Ions at the Advanced Light Source. In Leitner, M. (Ed.), Electron Cyclotron Resonance Ion Sources. 16th International Workshop on ECR Ion Sources. (pp. 88-91). American Institute of Physics. https://doi.org/10.1063/1.1893373