Conference paper
Authors list: Müller, A.; Bartsch, T.; Brandau, C.; Danared, H.; DeWitt, D.R.; Doerfert, J.; Dunn, G.H.; Gao, H.; Graham, W.G.; Hoffknecht, A.; Lebius, H.; Linkemann, J.; Pindzola, M.S.; Savin, D.W.; Schippers, S.; Schmitt, M.; Schuch, R.; Schwalm, D.; Spies, W.; Uwira, O.; Wolf, A.; Zong, W.
Appeared in: Application of accelerators in research and industry. Proceedings of the Fourteenth International Conference on the Application of Accelerators in Research and Industry, Vol. 1
Editor list: Duggan, J.L.
Publication year: 1997
Pages: 31-34
ISBN: 1-56396-710-3
DOI Link: https://doi.org/10.1063/1.52653
Conference: 14th International Conference on the Application of Accelerators in Research and Industry
Title of series: AIP conference proceedings
Number in series: 392
Recombination of highly charged ions with electrons is studied by accelerator based merged-beams experiments. In most measurements excessively high recombination rates are observed at low relative energies which cannot be explained by ordinary radiative recombination. The enhanced rates lead to serious losses of ions during the electron cooling process in ion storage rings. Another type of rate enhancement, known from previous experiments on dielectronic recombination, is related to external fields in the electron-ion collision region. By introducing controlled electric fields in the cooler of a storage ring it has been possible for the first time to obtain quantitative results for effects of electric fields on dielectronic recombination of highly charged ions.
Abstract:
Citation Styles
Harvard Citation style: Müller, A., Bartsch, T., Brandau, C., Danared, H., DeWitt, D., Doerfert, J., et al. (1997) Enhancement effects on electron-ion recombination rates, in Duggan, J. (ed.) Application of accelerators in research and industry. Proceedings of the Fourteenth International Conference on the Application of Accelerators in Research and Industry, Vol. 1. Woodbury, NY: American Institute of Physics. pp. 31-34. https://doi.org/10.1063/1.52653
APA Citation style: Müller, A., Bartsch, T., Brandau, C., Danared, H., DeWitt, D., Doerfert, J., Dunn, G., Gao, H., Graham, W., Hoffknecht, A., Lebius, H., Linkemann, J., Pindzola, M., Savin, D., Schippers, S., Schmitt, M., Schuch, R., Schwalm, D., Spies, W., ...Zong, W. (1997). Enhancement effects on electron-ion recombination rates. In Duggan, J. (Ed.), Application of accelerators in research and industry. Proceedings of the Fourteenth International Conference on the Application of Accelerators in Research and Industry, Vol. 1. (pp. 31-34). American Institute of Physics. https://doi.org/10.1063/1.52653