Journalartikel

Jahr der Veröffentlichung: 2004

Seiten: 2008-2013

Zeitschrift: Journal of Materials Research

Bandnummer: 19

Heftnummer: 7

ISSN: 0884-2914

DOI Link: https://doi.org/10.1557/JMR.2004.0264

Verlag: Springer

Abstract: 
Thin films of perfluorinated vanadyl phthalocyanine F16PcVO were prepared by physical vapor deposition in high vacuum on KBr and fused silica substrates. The absorption spectra in the visible region show that the films on different substrates have different structure. The optical constants for F16PcVO films were obtained in the spectral range of 0.7-4.5 eV from the simulation of ellipsometry spectra with an anisotropic uniaxial model. From the difference between the in-plane and out-of-plane components of the extinction coefficient the average tilt angle of the F16PcVO molecular planes with respect to the substrate plane was found to be 56degrees for fused silica substrates and between 0degrees and 3degrees for KBr substrates.

Harvard-Zitierstil: Gordan, O., Friedrich, M., Michaelis, W., Kröger, R., Kampen, T., Schlettwein, D., et al. (2004) Determination of the anisotropic optical properties for perfluorinated vanadyl phthalocyanine thin films, Journal of Materials Research, 19(7), pp. 2008-2013. https://doi.org/10.1557/JMR.2004.0264

APA-Zitierstil: Gordan, O., Friedrich, M., Michaelis, W., Kröger, R., Kampen, T., Schlettwein, D., & Zahn, D. (2004). Determination of the anisotropic optical properties for perfluorinated vanadyl phthalocyanine thin films. Journal of Materials Research. 19(7), 2008-2013. https://doi.org/10.1557/JMR.2004.0264