Konferenzpaper

Erschienen in: Charge generation/transport in organic semiconductor materials

Herausgeberliste: Anthony, J.

Jahr der Veröffentlichung: 2011

Seiten: 78-84

ISBN: 978-1-62748-220-2

DOI Link: https://doi.org/10.1557/opl.2012.366

Konferenz: 2011 MRS fall meeting

Serientitel: Materials Research Society symposium proceedings

Serienzählung: 1402

Abstract: 

Thin films (50 nm) of 2,5-di-4-biphenylthiophene (PPTPP), 5,5′-di-4-biphenylyl-2,2′-bithiophene (PPTTPP) and 4,4′-di-2,2′-bithienylbiphenyl (TTPPTT) were vapor-deposited on microstructured gold (source- and drain-) electrode arrays on thermal SiO₂ as gate dielectric with underlying Si serving as gate electrode. The films were studied in their field-effect characteristics during film growth and subsequent to it. A decay of specific conductivity and of charge carrier mobility was observed in subsequent measurements. During annealing without an applied field the films recovered but showed a second decay as soon as an electric field was applied again for repeated characterization. Induced dipoles and subsequent structural changes as well as chemical interactions with the SiO₂ interface are discussed as possible origins of these observations.

Harvard-Zitierstil: Keil, C., Müntze, F., Schiek, M., Lützen, A. and Schlettwein, D. (2011) Influence of an Applied Electric Field on the Conduction Characteristics of a Bithienyl-Capped Biphenylene and Biphenyl-Capped Oligothiophenes in Organic Field-Effect Transistor Structures, in Anthony, J. (ed.) Charge generation/transport in organic semiconductor materials. New York, NY: Cambridge Univ. Press. pp. 78-84. https://doi.org/10.1557/opl.2012.366

APA-Zitierstil: Keil, C., Müntze, F., Schiek, M., Lützen, A., & Schlettwein, D. (2011). Influence of an Applied Electric Field on the Conduction Characteristics of a Bithienyl-Capped Biphenylene and Biphenyl-Capped Oligothiophenes in Organic Field-Effect Transistor Structures. In Anthony, J. (Ed.), Charge generation/transport in organic semiconductor materials. (pp. 78-84). Cambridge Univ. Press. https://doi.org/10.1557/opl.2012.366