Meeting Abstract
Mask-triggered thrust reversal in the Negative Compatibility Effect
Autorenliste: Schmidt, T; Hauch, V; Schmidt, F
Jahr der Veröffentlichung: 2015
Seiten: 186-187
Zeitschrift: Perception
Bandnummer: 44
Heftnummer: SI
ISSN: 0301-0066
eISSN: 1468-4233
DOI Link: https://doi.org/10.1177/0301006615598674
Konferenz: 38th European Conference on Visual Perception (ECVP)
Verlag: SAGE Publications
Zitierstile
Harvard-Zitierstil: Schmidt, T., Hauch, V. and Schmidt, F. (2015) Mask-triggered thrust reversal in the Negative Compatibility Effect, Perception, 44(SI), pp. 186-187. https://doi.org/10.1177/0301006615598674
APA-Zitierstil: Schmidt, T., Hauch, V., & Schmidt, F. (2015). Mask-triggered thrust reversal in the Negative Compatibility Effect. Perception. 44(SI), 186-187. https://doi.org/10.1177/0301006615598674
