Journalartikel
Autorenliste: Dargel, R; Azeroual, M; Mogwitz, B; Janek, J; Vogt, C
Jahr der Veröffentlichung: 2007
Seiten: 7375-7380
Zeitschrift: Journal of Materials Science
Bandnummer: 42
Heftnummer: 17
ISSN: 0022-2461
eISSN: 1573-4803
DOI Link: https://doi.org/10.1007/s10853-006-1310-2
Verlag: Springer
Abstract:
Thin films of silver selenide with varying composition have been deposited on magnesium oxide substrates with pulsed laser deposition and were investigated via micro-XRF. A calibration procedure was designed to determine the absolute thicknesses of the films. The lateral homogeneity was investigated by elemental mapping, thus delivering information about the deposition process. Wet chemical analysis was performed on the dissolved layers with ICP-OES and ICP-MS to determine the stoichiometry of the Ag (x) Se (y) . The results suggest a correlation between the composition of the layers and their thicknesses by showing a silver enrichment for thinner layers.
Zitierstile
Harvard-Zitierstil: Dargel, R., Azeroual, M., Mogwitz, B., Janek, J. and Vogt, C. (2007) Non-destructive analysis of silver selenide films obtained by Pulsed Laser Deposition (PLD) with Micro-XRF, Journal of Materials Science, 42(17), pp. 7375-7380. https://doi.org/10.1007/s10853-006-1310-2
APA-Zitierstil: Dargel, R., Azeroual, M., Mogwitz, B., Janek, J., & Vogt, C. (2007). Non-destructive analysis of silver selenide films obtained by Pulsed Laser Deposition (PLD) with Micro-XRF. Journal of Materials Science. 42(17), 7375-7380. https://doi.org/10.1007/s10853-006-1310-2