Journal article
Authors list: Taylor, MA; Kilo, M; Argirusis, C; Borchardt, G; Valov, I; Korte, C; Janek, J; Rödel, TC; Lerch, M
Publication year: 2005
Pages: 479-484
Journal: Defect and Diffusion Forum
Volume number: 237-240
ISSN: 1012-0386
ISBN: 3-908451-07-8
DOI Link: https://doi.org/10.4028/www.scientific.net/DDF.237-240.479
Publisher: Trans Tech Publications
Abstract:
Anion diffusion in yttrium doped zirconium oxonitrides was investigated using the rare stable tracer (15)N. The tracer was deposited onto the samples using pulsed laser deposition of zirconia in a (15)N(2)-containing atmosphere. Diffusion anneals were performed in vacuum, and the depth distribution of the tracer was investigated using secondary ion mass spectroscopy. The observed nitrogen diffusivities are slightly higher than the ones obtained previously using samples with implanted nitrogen. The activation energy of nitrogen diffusion is above 2 eV.
Citation Styles
Harvard Citation style: Taylor, M., Kilo, M., Argirusis, C., Borchardt, G., Valov, I., Korte, C., et al. (2005) Nitrogen tracer diffusion in yttria doped zirconium oxonitride, Defect and Diffusion Forum, 237-240, pp. 479-484. https://doi.org/10.4028/www.scientific.net/DDF.237-240.479
APA Citation style: Taylor, M., Kilo, M., Argirusis, C., Borchardt, G., Valov, I., Korte, C., Janek, J., Rödel, T., & Lerch, M. (2005). Nitrogen tracer diffusion in yttria doped zirconium oxonitride. Defect and Diffusion Forum. 237-240, 479-484. https://doi.org/10.4028/www.scientific.net/DDF.237-240.479
