Voltage- and Frequency-Based Separation of Nanoscale Electromechanical and Electrostatic Forces in Contact Resonance Force Microscopy: Implications for the Analysis of Battery Materials - Research portal of Justus Liebig University Giessen:

Journalartikel

Voltage- and Frequency-Based Separation of Nanoscale Electromechanical and Electrostatic Forces in Contact Resonance Force Microscopy: Implications for the Analysis of Battery Materials

Autorenliste: Badur, Sebastian; Renz, Diemo; Goeddenhenrich, Thomas; Ebeling, Daniel; Roling, Bernhard; Schirmeisen, Andre

Jahr der Veröffentlichung: 2020

Seiten: 7397-7405

Zeitschrift: ACS Applied Nano Materials

Bandnummer: 3

Heftnummer: 8

ISSN: 2574-0970

DOI Link: https://doi.org/10.1021/acsanm.0c00989

Verlag: American Chemical Society

Abstract:
In piezoresponse force microscopy and electrochemical strain microscopy (PFM, ESM), not only nanoscale electromechanical surface displacements (e.g., Vegard strain in case of ESM) are amplified in contact resonance; global cantilever capacitive forces are as well. In addition, other nanoscale nonelectrical contact mechanics could contribute to the contrast formation, too. Here we propose a method to separate these contributions by using the band excitation method together with an amplitude modulated high-frequency electric potential applied to the cantilever. Compared to the conventional DC biased low-frequency AC contact resonance mode, this allows us to determine voltage and frequency-dependent nanoscale surface responses quantitatively, because the capacitive components are deducted. Numerical simulations based on the Euler-Bernoulli equation together with experiments on Li-ion conducting glass ceramics (LICGCs) and on the mixed Cu-ion/electron-conducting material Cu2Mo6S8 demonstrate the advantages of this approach.

Zitierstile

Harvard-Zitierstil: Badur, S., Renz, D., Goeddenhenrich, T., Ebeling, D., Roling, B. and Schirmeisen, A. (2020) Voltage- and Frequency-Based Separation of Nanoscale Electromechanical and Electrostatic Forces in Contact Resonance Force Microscopy: Implications for the Analysis of Battery Materials, ACS Applied Nano Materials, 3(8), pp. 7397-7405. https://doi.org/10.1021/acsanm.0c00989

APA-Zitierstil: Badur, S., Renz, D., Goeddenhenrich, T., Ebeling, D., Roling, B., & Schirmeisen, A. (2020). Voltage- and Frequency-Based Separation of Nanoscale Electromechanical and Electrostatic Forces in Contact Resonance Force Microscopy: Implications for the Analysis of Battery Materials. ACS Applied Nano Materials. 3(8), 7397-7405. https://doi.org/10.1021/acsanm.0c00989

Zitierstile

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