Journal article

Publication year: 2020

Pages: 7397-7405

Journal: ACS Applied Nano Materials

Volume number: 3

Issue number: 8

ISSN: 2574-0970

DOI Link: https://doi.org/10.1021/acsanm.0c00989

Publisher: American Chemical Society

Abstract: 
In piezoresponse force microscopy and electrochemical strain microscopy (PFM, ESM), not only nanoscale electromechanical surface displacements (e.g., Vegard strain in case of ESM) are amplified in contact resonance; global cantilever capacitive forces are as well. In addition, other nanoscale nonelectrical contact mechanics could contribute to the contrast formation, too. Here we propose a method to separate these contributions by using the band excitation method together with an amplitude modulated high-frequency electric potential applied to the cantilever. Compared to the conventional DC biased low-frequency AC contact resonance mode, this allows us to determine voltage and frequency-dependent nanoscale surface responses quantitatively, because the capacitive components are deducted. Numerical simulations based on the Euler-Bernoulli equation together with experiments on Li-ion conducting glass ceramics (LICGCs) and on the mixed Cu-ion/electron-conducting material Cu2Mo6S8 demonstrate the advantages of this approach.

Harvard Citation style: Badur, S., Renz, D., Goeddenhenrich, T., Ebeling, D., Roling, B. and Schirmeisen, A. (2020) Voltage- and Frequency-Based Separation of Nanoscale Electromechanical and Electrostatic Forces in Contact Resonance Force Microscopy: Implications for the Analysis of Battery Materials, ACS Applied Nano Materials, 3(8), pp. 7397-7405. https://doi.org/10.1021/acsanm.0c00989

APA Citation style: Badur, S., Renz, D., Goeddenhenrich, T., Ebeling, D., Roling, B., & Schirmeisen, A. (2020). Voltage- and Frequency-Based Separation of Nanoscale Electromechanical and Electrostatic Forces in Contact Resonance Force Microscopy: Implications for the Analysis of Battery Materials. ACS Applied Nano Materials. 3(8), 7397-7405. https://doi.org/10.1021/acsanm.0c00989