Journalartikel

Effect of localized boron impurities on the line shape of the fundamental band gap transition in photomodulated reflectance spectra of (B, Ga, In)As


AutorenlisteSander, T.; Teubert, J.; Klar, P. J.; Lindsay, A.; O'Reilly, E. P.

Jahr der Veröffentlichung2011

ZeitschriftPhysical Review B

Bandnummer83

Heftnummer23

ISSN1098-0121

DOI Linkhttps://doi.org/10.1103/PhysRevB.83.235213

VerlagAmerican Physical Society


Abstract
Photomodulated reflectance (PR) spectra of (B, Ga, In) As epilayers reveal unusual changes of the fundamental band gap PR line shape with temperature and hydrostatic pressure. We show that these changes arise because temperature variation or hydrostatic pressure shifts the conduction band edge (CBE) into resonance with boron-related cluster states. The resulting line shape changes are described by a level repulsion model which yields states of mixed character with an exchange of oscillator strengths. This model is corroborated by theoretical calculations which show a finite density of boron cluster states above the CBE at room temperature, with appropriate symmetry to couple to the CBE state.



Zitierstile

Harvard-ZitierstilSander, T., Teubert, J., Klar, P., Lindsay, A. and O'Reilly, E. (2011) Effect of localized boron impurities on the line shape of the fundamental band gap transition in photomodulated reflectance spectra of (B, Ga, In)As, Physical review B, 83(23), Article 235213. https://doi.org/10.1103/PhysRevB.83.235213

APA-ZitierstilSander, T., Teubert, J., Klar, P., Lindsay, A., & O'Reilly, E. (2011). Effect of localized boron impurities on the line shape of the fundamental band gap transition in photomodulated reflectance spectra of (B, Ga, In)As. Physical review B. 83(23), Article 235213. https://doi.org/10.1103/PhysRevB.83.235213



Schlagwörter


ALLOYSBXGA1-XASELECTRONIC-STRUCTUREEMITTING LASER STRUCTURESMODULATION SPECTROSCOPY


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