Journalartikel
Autorenliste: Sander, T.; Teubert, J.; Klar, P. J.; Lindsay, A.; O'Reilly, E. P.
Jahr der Veröffentlichung: 2011
Zeitschrift: Physical Review B
Bandnummer: 83
Heftnummer: 23
ISSN: 1098-0121
DOI Link: https://doi.org/10.1103/PhysRevB.83.235213
Verlag: American Physical Society
Abstract:
Photomodulated reflectance (PR) spectra of (B, Ga, In) As epilayers reveal unusual changes of the fundamental band gap PR line shape with temperature and hydrostatic pressure. We show that these changes arise because temperature variation or hydrostatic pressure shifts the conduction band edge (CBE) into resonance with boron-related cluster states. The resulting line shape changes are described by a level repulsion model which yields states of mixed character with an exchange of oscillator strengths. This model is corroborated by theoretical calculations which show a finite density of boron cluster states above the CBE at room temperature, with appropriate symmetry to couple to the CBE state.
Zitierstile
Harvard-Zitierstil: Sander, T., Teubert, J., Klar, P., Lindsay, A. and O'Reilly, E. (2011) Effect of localized boron impurities on the line shape of the fundamental band gap transition in photomodulated reflectance spectra of (B, Ga, In)As, Physical review B, 83(23), Article 235213. https://doi.org/10.1103/PhysRevB.83.235213
APA-Zitierstil: Sander, T., Teubert, J., Klar, P., Lindsay, A., & O'Reilly, E. (2011). Effect of localized boron impurities on the line shape of the fundamental band gap transition in photomodulated reflectance spectra of (B, Ga, In)As. Physical review B. 83(23), Article 235213. https://doi.org/10.1103/PhysRevB.83.235213
Schlagwörter
ALLOYS; BXGA1-XAS; ELECTRONIC-STRUCTURE; EMITTING LASER STRUCTURES; MODULATION SPECTROSCOPY