Journalartikel

Jahr der Veröffentlichung: 2005

Seiten: 1151-1157

Zeitschrift: Astronomy & Astrophysics

Bandnummer: 437

Heftnummer: 3

ISSN: 0004-6361

Open Access Status: Bronze

DOI Link: https://doi.org/10.1051/0004-6361:20042500

Verlag: EDP Sciences

Abstract: 
The dielectronic recombination rate coefficients of N V and Ne VIII ions have been measured at a heavy-ion storage ring. The investigated energy ranges covered all dielectronic recombination resonances attached to 2s -> 2p (Delta n = 0) core excitations. The rate coefficients in a plasma were derived and parameterized by using a convenient fit formula. The experimentally derived rate coefficients were then compared to theoretical data. In addition the influence of external electric fields with field strengths up to 1300 V/cm on the dielectronic recombination rate coefficient was investigated.

Harvard-Zitierstil: Böhm, S., Müller, A., Schippers, S., Shi, W., Fogle, M., Glans, P., et al. (2005) Experimental NV and NeVIII low-temperature dielectronic recombination rate coefficients, Astronomy & Astrophysics, 437(3), pp. 1151-1157. https://doi.org/10.1051/0004-6361:20042500

APA-Zitierstil: Böhm, S., Müller, A., Schippers, S., Shi, W., Fogle, M., Glans, P., Schuch, R., & Danared, H. (2005). Experimental NV and NeVIII low-temperature dielectronic recombination rate coefficients. Astronomy & Astrophysics. 437(3), 1151-1157. https://doi.org/10.1051/0004-6361:20042500