Journal article
Authors list: Böhm, S; Müller, A; Schippers, S; Shi, W; Fogle, M; Glans, P; Schuch, R; Danared, H
Publication year: 2005
Pages: 1151-1157
Journal: Astronomy & Astrophysics
Volume number: 437
Issue number: 3
ISSN: 0004-6361
Open access status: Bronze
DOI Link: https://doi.org/10.1051/0004-6361:20042500
Publisher: EDP Sciences
Abstract:
The dielectronic recombination rate coefficients of N V and Ne VIII ions have been measured at a heavy-ion storage ring. The investigated energy ranges covered all dielectronic recombination resonances attached to 2s -> 2p (Delta n = 0) core excitations. The rate coefficients in a plasma were derived and parameterized by using a convenient fit formula. The experimentally derived rate coefficients were then compared to theoretical data. In addition the influence of external electric fields with field strengths up to 1300 V/cm on the dielectronic recombination rate coefficient was investigated.
Citation Styles
Harvard Citation style: Böhm, S., Müller, A., Schippers, S., Shi, W., Fogle, M., Glans, P., et al. (2005) Experimental NV and NeVIII low-temperature dielectronic recombination rate coefficients, Astronomy & Astrophysics, 437(3), pp. 1151-1157. https://doi.org/10.1051/0004-6361:20042500
APA Citation style: Böhm, S., Müller, A., Schippers, S., Shi, W., Fogle, M., Glans, P., Schuch, R., & Danared, H. (2005). Experimental NV and NeVIII low-temperature dielectronic recombination rate coefficients. Astronomy & Astrophysics. 437(3), 1151-1157. https://doi.org/10.1051/0004-6361:20042500
Keywords
ATOMIC DATA; atomic processes; CROSS-SECTIONS; ELECTRIC-FIELD; FINITE-DENSITY PLASMAS; INTERMEDIATE-COUPLING CALCULATIONS; ISOELECTRONIC SEQUENCE; line : formation; MAGNETIC-FIELDS; PHOTOIONIZATION; Plasmas; radiation mechanisms : general
