Conference paper

Strong contributions of indirect processes to the electron-impact ionization cross section of Sc+ ions


Authors listJacobi, J; Knopp, H; Schippers, S; Shi, W; Müller, A

Publication year2003

Pages410-412

JournalNuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms

Volume number205

ISSN0168-583X

DOI Linkhttps://doi.org/10.1016/S0168-583X(02)02043-8

Conference11th International Conference on the Physics of Highly Charged Ions (HCI 2002)

PublisherElsevier


Abstract
The absolute electron-impact ionization cross section of Sc+ ions was measured by employing the crossed beams technique. We find pronounced contributions (up to similar to30%) of indirect processes to the total ionization cross section. This finding is related to the existence of exceptionally strong 3p --> 3d excitation channels in Sc+(3p(6)3d4s). (C) 2003 Elsevier Science B.V. All rights reserved.



Citation Styles

Harvard Citation styleJacobi, J., Knopp, H., Schippers, S., Shi, W. and Müller, A. (2003) Strong contributions of indirect processes to the electron-impact ionization cross section of Sc+ ions, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 205, pp. 410-412. https://doi.org/10.1016/S0168-583X(02)02043-8

APA Citation styleJacobi, J., Knopp, H., Schippers, S., Shi, W., & Müller, A. (2003). Strong contributions of indirect processes to the electron-impact ionization cross section of Sc+ ions. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 205, 410-412. https://doi.org/10.1016/S0168-583X(02)02043-8



Keywords


autoionizationcrossed beamselectron-impact ionizationscandium ions

Last updated on 2025-24-06 at 08:30